| 000 | 00754nam a2200241 a 4500 | ||
|---|---|---|---|
| 008 | 170703s1981####nyuad||f#|||||00| 0#eng#d | ||
| 003 | AR-SmCIES | ||
| 020 | _a0824712668 | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 091 | _a1710 PMTM | ||
| 100 | 1 | _aJenkins, Ronald | |
| 245 | 1 | 0 | _aQuantitative Xray spectrometry. |
| 260 |
_aNew York and Basel : _bMarcel Dekker, _c1981. |
||
| 300 |
_aviii, 586 p. : _bil., tabla, diagr. |
||
| 500 | _aApéndices: p.561-580 | ||
| 500 | _aBibliografía al final de cada capítulo | ||
| 650 | 4 | _aRAYOS X ANALISIS | |
| 650 | 4 | _aESPECTROS DE RAYOS X | |
| 700 | 1 | _aGould, Robert William | |
| 700 | 1 | _aGedcke, Dale | |
| 999 |
_c19885 _d19885 |
||