| 000 | 01147nam a2200325 a 4500 | ||
|---|---|---|---|
| 999 |
_c19868 _d19868 |
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| 003 | AR-SmCIES | ||
| 005 | 20221104161536.0 | ||
| 007 | 0306402807 | ||
| 008 | 170703s1979 --USad r E EN ENGEeng | ||
| 040 | _cAR-SmCIES | ||
| 091 | _a30196 | ||
| 245 | 1 | 0 | _aIntroduction to analytical electron microscopy. |
| 260 |
_aNew York: _bPlenum press, _c1979. |
||
| 300 |
_a601 p. : _bil. graf.; |
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| 500 | _aBibliografía al final de cada | ||
| 500 | _aContiene: Workshop on analytical electron microscopy. San Antonio, Tex., Aug. 13-14, 1979 | ||
| 650 | 4 |
_aMICROSCOPIA ELECTRONICA _93457 |
|
| 650 | 7 |
_aELECTRON MICROPROBE ANALYSIS _2INIST _94380 |
|
| 650 | 7 |
_aANALISIS CON MICROSONDA ELECTRONICA _2INIST _94381 |
|
| 650 | 7 |
_aMASS SPECTROSCOPY _92853 |
|
| 650 | 7 |
_aESPECTROMETRIA DE MASAS _2INIST _91264 |
|
| 650 | 7 |
_aRADIATION DAMAGE _2INIST _94382 |
|
| 700 | 1 | 0 |
_aHren, John _eEd. _94383 |
| 700 |
_93650 _aGoldstein, Joseph. _eEd. |
||
| 700 |
_93655 _aJoy, David C. _eEd. |
||
| 711 | 2 |
_aWorkshop on analytical electron microscopy _cSan Antonio, Tex.,US _d1979 _94384 |
|
| 942 |
_2udc _cBK |
||