000 01147nam a2200325 a 4500
999 _c19868
_d19868
003 AR-SmCIES
005 20221104161536.0
007 0306402807
008 170703s1979 --USad r E EN ENGEeng
040 _cAR-SmCIES
091 _a30196
245 1 0 _aIntroduction to analytical electron microscopy.
260 _aNew York:
_bPlenum press,
_c1979.
300 _a601 p. :
_bil. graf.;
500 _aBibliografía al final de cada
500 _aContiene: Workshop on analytical electron microscopy. San Antonio, Tex., Aug. 13-14, 1979
650 4 _aMICROSCOPIA ELECTRONICA
_93457
650 7 _aELECTRON MICROPROBE ANALYSIS
_2INIST
_94380
650 7 _aANALISIS CON MICROSONDA ELECTRONICA
_2INIST
_94381
650 7 _aMASS SPECTROSCOPY
_92853
650 7 _aESPECTROMETRIA DE MASAS
_2INIST
_91264
650 7 _aRADIATION DAMAGE
_2INIST
_94382
700 1 0 _aHren, John
_eEd.
_94383
700 _93650
_aGoldstein, Joseph.
_eEd.
700 _93655
_aJoy, David C.
_eEd.
711 2 _aWorkshop on analytical electron microscopy
_cSan Antonio, Tex.,US
_d1979
_94384
942 _2udc
_cBK