| 000 | 00649nam a2200181 a 4500 | ||
|---|---|---|---|
| 008 | 170703s1981####nyu||||f#|||||00| 0#eng#d | ||
| 003 | AR-SmCIES | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 091 | _a1491 PMTM | ||
| 100 | 1 | _aHeinrich, Kurt F. J. | |
| 245 | 1 | 0 | _aElectron beam x-ray microanalysis. |
| 260 |
_aNew York : _bVan Nostrand, _c1981. |
||
| 300 | _axxiii, 578 p. | ||
| 999 |
_c19853 _d19853 |
||