| 000 | 01143nam a2200349 a 4500 | ||
|---|---|---|---|
| 999 |
_c19825 _d19825 |
||
| 003 | AR-SmCIES | ||
| 005 | 20221027150838.0 | ||
| 008 | 170703s19771975n ado r e en eng | ||
| 020 | _a0306308207 | ||
| 040 | _cAR-SmCIES | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 091 | _a28406 | ||
| 245 | 1 | 0 |
_aPractical scanning electron microscopy: _belectron and ion microprobe analysis. |
| 250 | _a3a ed. | ||
| 260 |
_aNew York and London : _bPlenum press, _c1977. |
||
| 300 |
_axxiii, 582 p. : _bil., graf., fot.; |
||
| 650 | 4 |
_aMICROSCOPIA ELECTRONICA _93457 |
|
| 650 | 7 |
_aELECTRON BEAMS _2INIST _93316 |
|
| 650 | 7 |
_aHACES ELECTRONICOS _2INIST _93317 |
|
| 650 | 7 |
_aSCANNING ELECTRON _2INIST _94314 |
|
| 650 | 7 |
_aX-RAY EMISSION ANALYSIS _2INIST _94315 |
|
| 650 | 7 |
_aANALISIS POR EMISION DE RAYOS X _2INIST _94316 |
|
| 650 | 7 |
_aSONDAS ELECTRONICAS _2INIST _94317 |
|
| 650 | 4 |
_aELECTRON PROBES _2INIST _94318 |
|
| 700 | 1 |
_aYakowitz, Harvey _eEd. _94319 |
|
| 700 |
_aGoldstein, Joseph. _eEd. _93650 |
||
| 700 |
_aNewbury, Dale E. _93651 |
||
| 700 |
_aLifshin, E. _94320 |
||
| 700 |
_aColby, J. W. _94321 |
||
| 700 |
_aColeman, J. R. _94322 |
||
| 942 |
_2udc _cBK |
||