000 00662nam a2200241 a 4500
999 _c19663
_d19663
003 AR-SmCIES
005 20241113141936.0
008 170703s1973####nyu||||f#|||||00| 0#eng#d
041 7 _aen
_2ISO 639-1
091 _a434 PMM
100 1 _aAndersen, C.S.
_eed.
_99495
245 1 0 _aMicroprobe analysis.
260 _aNew York :
_bJ. Wiley,
_c1973.
300 _axi, 571 p.
650 _2SPINEST
_aTECNOLOG� A ELECTRÓNICA
_93919
650 _2SPINEST
_aELECTRONES
_9942
650 _2SPINEST
_aRAYOS X
_94536
650 _2INIST
_aSONDAS
_99496
650 _2INIST
_aANÁLISIS (ACTIVACIÓN)
_99497
942 _2udc
_cBK