| 000 | 00722nam a2200229 a 4500 | ||
|---|---|---|---|
| 008 | 170703s1997####nyua|||f#|||||00| 0#eng#d | ||
| 003 | AR-SmCIES | ||
| 020 | _a0471305243 | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 091 | _a47857 | ||
| 100 | 1 | _aKlockenkämper, Reinhold | |
| 245 | 1 | 0 | _aTotal reflection X ray fluorescence analysis. |
| 260 |
_aNew York : _bJohn Wiley, _c1997. |
||
| 300 |
_axvii, 245 p. : _bil. |
||
| 490 | 1 | _aChemical analysis, v.<140> | |
| 500 | _aBibliografía al final de cada capítulo | ||
| 650 | 4 | _aANALISIS FLUORIMETRICO | |
| 650 | 4 | _aANALISIS ESPECTROQUIMICO | |
| 830 | _aChemical analysis, v.<140> | ||
| 999 |
_c19183 _d19183 |
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