| 000 | 00687nam a2200217 a 4500 | ||
|---|---|---|---|
| 008 | 170703s1986####nyua|||f#|||||00| 0#eng#d | ||
| 003 | AR-SmCIES | ||
| 020 | _a0306423871 | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 091 | _a47847 | ||
| 100 | 1 |
_aJoy, David C. _eed. |
|
| 245 | 1 | 0 | _aPrinciples of analytical electron microscopy. |
| 260 |
_aNew York and London : _bPlenum Press, _c1986. |
||
| 300 |
_axvi, 448 p. : _bil. |
||
| 500 | _aBibliografía al final de cada capítulo | ||
| 650 | 4 | _aMICROSCOPIA ELECTRONICA | |
| 700 | 1 |
_aRomig, Alton D. _eed. |
|
| 700 | 1 |
_aGoldstein, Joseph I. _eed. |
|
| 999 |
_c19177 _d19177 |
||