| 000 | 00829nam a2200265 a 4500 | ||
|---|---|---|---|
| 008 | 170703s1996#### cnad||f#|||||00| 0#eng#d | ||
| 003 | AR-SmCIES | ||
| 020 | _a0660167026 | ||
| 022 | _a00670367 | ||
| 024 | 8 | _aAECL-11275 | |
| 024 | 8 | _aCOG-9577I | |
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 041 | 7 |
_afr _2ISO 639-1 |
|
| 091 | _a47707 | ||
| 100 | 1 | _aKhatamian, D. | |
| 710 | 2 | _aAtomic Energy of Canada Limited^pCA | |
| 245 | 1 | 0 | _aCrystal structure of thin oxide films grown on ZrNb alloys studied by RHEED [Reflection High Energy Electron Diffraction]. |
| 260 |
_aChalk River, Ontario : _bAECL, _c1996. |
||
| 300 |
_a13 p. : _btabla, diagr. |
||
| 500 | _aBibliografía: p.56 | ||
| 700 | 1 | _aLalonde, S. D. | |
| 999 |
_c19135 _d19135 |
||