| 000 | 00802nam a2200253 a 4500 | ||
|---|---|---|---|
| 008 | 170703s1995####nyua|||f#|||||00| 0#eng#d | ||
| 003 | AR-SmCIES | ||
| 020 | _a0471589446 | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 091 | _a47494 | ||
| 100 | 1 |
_aJohansson, Sven A. E. _eed. |
|
| 245 | 1 | 0 | _aParticleinduced Xray emission spectrometry [PIXE]. |
| 260 |
_aNew York : _bJohn Wiley, _c1995. |
||
| 300 |
_axxiii, 451 p. : _bil. |
||
| 490 | 1 | _aChemical analysis, no.<133> | |
| 500 | _aBibliografía al final de cada capítulo | ||
| 650 | 4 | _aANALISIS POR ESPECTROS DE EMISION | |
| 650 | 4 | _aPIXE | |
| 700 | 1 |
_aCampbell, John L. _eed. |
|
| 700 | 1 |
_aMalmqvist, Klas G. _eed. |
|
| 830 | _aChemical analysis, no.<133> | ||
| 999 |
_c18989 _d18989 |
||