| 000 | 00930nam a2200289 a 4500 | ||
|---|---|---|---|
| 999 |
_c17053 _d17053 |
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| 003 | AR-SmCIES | ||
| 005 | 20241114123314.0 | ||
| 008 | 170703s1989####xxua|||f#|||||00| 0#eng#d | ||
| 020 | _a0931837995 | ||
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 080 | _a543.063 | ||
| 100 | 1 |
_aMiller, Mike K. _99514 |
|
| 245 | 1 | 0 | _aAtom probe microanalysis: principles and applications to materials problems. |
| 260 |
_aPittsburgh: _bMaterials Research Society, _c1989 |
||
| 300 |
_axiv, 278 p.: _bilustraciones; figuras; . |
||
| 500 | _aApéndices al final de la obra | ||
| 500 | _aBibliografía al final de cada capítulo | ||
| 650 | 4 |
_aMATERIALES _2INIST _99515 |
|
| 650 | 4 |
_aMICROSCOP� A DE CAMPO IÓNICO _2INIST _99516 |
|
| 650 | 4 |
_aIONIZACIÓN _2INIST _93461 |
|
| 650 | 4 |
_aEVAPORACIÓN _2INIST _998 |
|
| 650 | 4 |
_aSONDAS _2INIST _99496 |
|
| 700 | 1 |
_aSmith, George D. W. _99517 |
|
| 942 |
_2udc _cBK |
||