000 | 05168nam a2200805 a 4500 | ||
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008 | 170703m1960uuuunyuad||f#|||||00| 0#eng#d | ||
003 | AR-SmCIES | ||
022 | _a0069-8490 | ||
041 | 7 |
_aen _2ISO 639-1 |
|
080 | _a543.422.8 | ||
091 | _a12537 | ||
092 | _av.1 | ||
111 | 2 |
_aConference on applications of X-ray analysis _n6- _cDenver, Colo,US _d1957- |
|
245 | 1 | 0 | _aADVANCES in X-ray analysis. |
260 |
_aNew YorkLondon : _bPlenum pressI. Pitman and sons, ltd., _c1960-. |
||
300 |
_a v. : _bil., tabla, diagr. ; 23,5-25,5 cm. |
||
500 | _aBibliografía al final de cada artículo | ||
591 | _aEl precio correponde a los v. 1-4; 6-7 | ||
591 | _av.13 inv. 18313 pertenece a E/1 se exportó a HISDOC y se borró de DOCSIS [ene 2017] | ||
650 | 4 | _aRAYOS X -ANALISIS | |
711 | 2 |
_aConference on industrial applications of X-ray analysis _n6- _cDenver, Colo,US _d1957- |
|
800 | 1 |
_aMueller, William Martin _eed. |
|
999 |
_c15082 _d15082 |