000 05168nam a2200805 a 4500
008 170703m1960uuuunyuad||f#|||||00| 0#eng#d
003 AR-SmCIES
022 _a0069-8490
041 7 _aen
_2ISO 639-1
080 _a543.422.8
091 _a12537
092 _av.1
111 2 _aConference on applications of X-ray analysis
_n6-
_cDenver, Colo,US
_d1957-
245 1 0 _aADVANCES in X-ray analysis.
260 _aNew YorkLondon :
_bPlenum pressI. Pitman and sons, ltd.,
_c1960-.
300 _a v. :
_bil., tabla, diagr. ; 23,5-25,5 cm.
500 _aBibliografía al final de cada artículo
591 _aEl precio correponde a los v. 1-4; 6-7
591 _av.13 inv. 18313 pertenece a E/1 se exportó a HISDOC y se borró de DOCSIS [ene 2017]
650 4 _aRAYOS X -ANALISIS
711 2 _aConference on industrial applications of X-ray analysis
_n6-
_cDenver, Colo,US
_d1957-
800 1 _aMueller, William Martin
_eed.
999 _c15082
_d15082