| 000 | 00936nam a2200253 a 4500 | ||
|---|---|---|---|
| 008 | 170703t1980####xxua|||f#|||||10| 0#eng#d | ||
| 003 | AR-SmCIES | ||
| 024 | 8 | _aASTM-STP-712 | |
| 041 | 7 |
_aen _2ISO 639-1 |
|
| 080 | _a621.382"1979" | ||
| 091 | _a33796 | ||
| 111 | 2 |
_aSymposium on lifetime factors in silicon _cSan Diego, Calif,US _d1979 |
|
| 245 | 1 | 0 | _aLifetime factors in silicon. |
| 260 |
_aPhiladelphia, Pa. : _bASTM, _cc1980. |
||
| 300 |
_a250 p. : _bil. ; 24 cm. |
||
| 490 | 1 | _aSpecial technical publication ; no.712 | |
| 500 | _aSpons. by ASTM committee F-1 on electronics | ||
| 500 | _aBibliografía al final de cada artículo | ||
| 650 | 4 | _aSEMICONDUCTORES -DISPOSITIVOS -CONGRESOS | |
| 810 | 2 | _aAmerican society for testing and materials, Filadelfia, Pa. | |
| 830 | _aSpecial technical publication ; no.712 | ||
| 999 |
_c14887 _d14887 |
||