| 000 | 00855nas a2200205 a 4500 | ||
|---|---|---|---|
| 008 | 170703d19801989nyub||p#r||||#00|#||eng#d | ||
| 003 | AR-SmCIES | ||
| 022 | _a0161-0457 | ||
| 222 | 0 | _aScanning; international journal of scanning electron microscopy and related methods | |
| 245 | 0 | 0 | _aScanning; international journal of scanning electron microscopy and related methods |
| 260 |
_aNew York, N.Y. : _bG. Witzstrock Publ. House, |
||
| 310 | _aBimestral | ||
| 590 | _a1980-84, 3-6 trimestral | ||
| 653 | _aELECTRONICA | ||
| 999 |
_c12795 _d12795 |
||