Your search returned 4 results.

Results
	1.	Image from Amazon.com Image from OpenLibrary	Industrial sensors and applications for condition monitoring. by Wild, Philip Material type: Text; Literary form: Not fiction ; Audience: Specialized; Language: en Publication details: London : Mechanical Engineering, 1994 Availability: Items available for loan: Centro de Información Eduardo Savino (1)Call number: 681.586 W643. Place hold Save to lists Add to cart (remove)
	2.	Image from OpenLibrary	Industrial optical sensors for metrology and inspection. by Harding, Kevin G [ed.] Stahl, H. Philip [ed.] Conference on industrial optical sensors for metrology and inspection Boston, Mass.,US 1994 Series: Society of photooptical instrumentation engineers, Bellingham, Wash ; \| Proceedings series, v.<2349> Material type: Text; Literary form: Not fiction ; Audience: Specialized; Language: en Language: en Publication details: Bellingham, Wash. : SPIEThe International Society for Optical Engineering, 1995 Availability: Items available for loan: Centro de Información Eduardo Savino (1)Call number: 681.7 H219 1994. Place hold Save to lists Add to cart (remove)
	3.	Image from Amazon.com Image from OpenLibrary	Optical sensors. by Wagner, Elmar [ed.] Dändliker, R [ed.] Spenner, K [ed.] Series: Göpel, Wolfgang ; \| Hesse, J ; \| Zemel, J. N ; Material type: Text; Literary form: Not fiction ; Audience: Specialized; Language: en Publication details: Weinheim : VCH, 1992 Availability: Items available for loan: Centro de Información Eduardo Savino (1)Call number: 681.586 Se59 v.6. Place hold Save to lists Add to cart (remove)
	4.	Image from Amazon.com Image from OpenLibrary	Physics of semiconductor devices. by Sze, Simon Min, 1936 Ng, Kwok Kwok, 1952 Material type: Text; Literary form: Not fiction ; Audience: Specialized; Language: en Publication details: Hoboken, N.J. : Wiley Interscience, 2007 Availability: Not available: Centro de Información Eduardo Savino: Lost (1). Save to lists Add to cart (remove)