Amazon cover image
Image from Amazon.com
Image from OpenLibrary

Accelerated testing : statistical models, test plans, and data analyses [sic].

By: Material type: TextTextLanguage: en Series: Wiley series in probability and statisticsPublication details: Hoboken, N.J. : Wiley Interscience, 2004.Description: xiv, 601 p. : tabla, diagrISBN:
  • 0471697362
Subject(s):
Tags from this library: No tags from this library for this title. Log in to add tags.
Holdings
Item type Home library Call number Status Date due Barcode
Books Books Centro de Información Eduardo Savino 620.199: 519.2 N332 2004 (Browse shelf(Opens below)) Checked out 18/12/2025 50308
Total holds: 0

Ejercicios al final de cada capítulo

Apéndices y bibliografía: p.549-577

There are no comments on this title.

to post a comment.