Amazon cover image
Image from Amazon.com
Image from OpenLibrary

Materials characterization using nondestructive evaluation (NDE) methods / edited by Gerhard Hübschen [et al.]

Contributor(s): Material type: TextTextLanguage: English Series: Woodhead Publishing series in electronic and optical materials ; no. 88.Publisher: Amsterdam ; Boston : Elsevier/Woodhead Publishing, c2016Description: xv, 303 p. : il. (algunas col.) 24 cmISBN:
  • 9780081000403
Subject(s): DDC classification:
  • 620.1/127 23
Contents:
1. Atomic force microscopy (AFM) for materials characterization / M.K. Khan, Q.Y. Wang, M.E. Fitzpatrick. 2. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization / B.J. Inkson. 3. X-ray microtomography for materials characterization / R. Hanke, T. Fuchs, M. Salamon, S. Zabler. 4. X-ray diffraction (XRD) techniques for materials characterization / J. Epp. 5. Microwave, millimeter wave and terahertz (MMT) techniques for materials characterization / C. Sklarczyk. 6. Acoustic microscopy for materials characterization / R.Gr. Maev. 7. Ultrasonic techniques for materials characterization -- G. Hübschen. 8. Electromagnetic techniques for materials characterization / I. Altpeter, R. Tschuncky, K. Szielasko. 9. Hybrid methods for materials characterization / R. Tschuncky, K. Szielasko, I. Altpeter.
Tags from this library: No tags from this library for this title. Log in to add tags.
Holdings
Item type Home library Call number Status Barcode
Books Books Centro de Información Eduardo Savino Revistero 620.179.1 M425 (Browse shelf(Opens below)) Available 51402
Total holds: 0

Includes bibliographical references and index.

1. Atomic force microscopy (AFM) for materials characterization / M.K. Khan, Q.Y. Wang, M.E. Fitzpatrick. 2. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization / B.J. Inkson. 3. X-ray microtomography for materials characterization / R. Hanke, T. Fuchs, M. Salamon, S. Zabler. 4. X-ray diffraction (XRD) techniques for materials characterization / J. Epp. 5. Microwave, millimeter wave and terahertz (MMT) techniques for materials characterization / C. Sklarczyk. 6. Acoustic microscopy for materials characterization / R.Gr. Maev. 7. Ultrasonic techniques for materials characterization -- G. Hübschen. 8. Electromagnetic techniques for materials characterization / I. Altpeter, R. Tschuncky, K. Szielasko. 9. Hybrid methods for materials characterization / R. Tschuncky, K. Szielasko, I. Altpeter.

There are no comments on this title.

to post a comment.