TY  - BOOK
AU  - Loretto,M.H.
AU  - Smallman, R. E.
TI  - Defect analysis in elctron microscopy
SN  - 0412137607
PY  - 1975///
CY  - Londres: 
PB  - Chapman and Hall, 
KW  - INIST
KW  - MICROSCOPIA ELECTRONICA
KW  - ELECTRON MICROSCOPY
KW  - DEFECTOS
KW  - DIFRACCION ELECTRONICA
KW  - DEFECTOS CRISTALINOS
KW  - TRANSMISSION ELECTRON MICROSCOPY
KW  - MICROSCOPIA ELECTRONICA POR TRANSMISION
KW  - DISLOCATIONS
KW  - KIKUCHI LINES
KW  - LINEAS DE KIKUCHI
ER  -