Defect analysis in elctron microscopy - Loretto, M. H.; Smallman, R. E. (Londres: Chapman and Hall, 1975)
Keywords: MICROSCOPIA ELECTRONICA; ELECTRON MICROSCOPY; DEFECTOS; DIFRACCION ELECTRONICA; DEFECTOS CRISTALINOS; TRANSMISSION ELECTRON MICROSCOPY; MICROSCOPIA ELECTRONICA POR TRANSMISION; DISLOCATIONS; KIKUCHI LINES; LINEAS DE KIKUCHI