TY  - BOOK
AU  - Amelinckx, S.
AU  - Gevers, R.
AU  - Van Landuyt, J.
TI  - Diffraction and imaginig techniques in material science
SN  - 0444851291
PY  - 1978///
CY  - Amsterdam: 
PB  - North-Holland, 
KW  - INIST
KW  - MICROSCOPIA ELECTRONICA
KW  - ELECTRON MICROSCOPY
KW  - LOW ENERGY ELECTRON DIFFRACTION
KW  - DIFRACCION DE ELECTRONES DE BAJA ENERGIA
KW  - DIFRACCION DE RAYOS X
KW  - X-RAY DIFFRACTION
KW  - FIELD EMISSION MICROSCOPY
KW  - MICROSCOPIA DE EMISION DE CAMPO
KW  - MIRROR ELECTRON MICROSCOPY
ER  -