Diffraction and imaginig techniques in material science - Amelinckx, S.; Gevers, R.; Van Landuyt, J. (Amsterdam: North-Holland, 1978)
Keywords: MICROSCOPIA ELECTRONICA; ELECTRON MICROSCOPY; LOW ENERGY ELECTRON DIFFRACTION; DIFRACCION DE ELECTRONES DE BAJA ENERGIA; DIFRACCION DE RAYOS X; X-RAY DIFFRACTION; FIELD EMISSION MICROSCOPY; MICROSCOPIA DE EMISION DE CAMPO; MIRROR ELECTRON MICROSCOPY