TY  - BOOK
AU  - Amelinckx, S.
AU  - Gevers, R.
AU  - Van Landuyt, J.
TI  - Diffraction and imaging techniques in material science
SN  - 0444851283
PY  - 1978///
CY  - Amsterdam: 
PB  - North-Holland, 
KW  - INIST
KW  - DIFFRACTION
KW  - ELECTRON MICROSCOPY
KW  - MICROSCOPIA ELECTRONICA
KW  - ELECTRON DIFFRACTION
KW  - DIFRACCION ELECTRONICA
KW  - ATOMIC CLUSTERS
KW  - AGRUPACIONES ATOMICAS
KW  - X-RAY DIFFRACTION
ER  -