Goldstein, Joseph. <br/><br/>
Scanning electron microscopy and x-ray microanalysis. 

 - 4th ed. 
 - 554 p.  il. 
<br/><br/><label>ISBN: </label>9781493966745 
<br/><br/><label>Subjects--Topical Terms: </label><br/>ION BEAMS<br/>HACES DE IONES
<br/><br/><label>Subjects--Index Terms: </label>Electron backscatter diffraction Environmental SEM Qualitative X-ray analysis Quantitative X-ray analysis X-ray mapping