TY  - BOOK
AU  - Beck,Friedrich
TI  - Integrated circuit failure analysis: a guide to preparation techniques 
SN  - 0471974013
U1  - 621.3815 21
PY  - 1998///
CY  - Chichester, New York
PB  - Wiley
KW  - Circuitos integrados
KW  - SEMICONDUCTORES
KW  - Fallos
KW  - Ensayos
KW  - Electronica
KW  - Confiabilidad
N1  - Incluye bibliografía e índice analítico; Purpose and importance of preparatory semiconductor analysis -- Opening the package. Chip insulation -- Wet chemical etching procedures for removing layers of the chip structure -- Crystallographic etching in the silicon -- Dry etching the plasma -- Microsectioning technology, metallography -- Appendix 1: advice on health and safety at work -- Appendix 2: list of manufacturers and suppliers
ER  -