Instrumentation for PIXE [Particle Induced X ray Emission] and RBS [Rutherford Backscattering Spectometry]. 

 - Vienna :  IAEA,  2000. 
 - 71 p. :  tabla, diagr. 
<br/><br/> Bibliografía: p.65-70 
<br/><br/><label>ISSN: </label>1011-4289 
<br/><br/><label>Standard No.: </label>IAEA-TECDOC-1190