TY  - BOOK
AU  - Head,A.K.
AU  - Humble,P.
AU  - Clarebrough,L.M.
AU  - Morton,A.J.
AU  - Forwood,C.T.
TI  - Computed electron micrographs and defect identification
T2  - Series defects in crystalline solids, v. <7>
SN  - 0720417570
PY  - 1973///
CY  - AmsterdamNew York, N.Y.
PB  - NorthHollandAmerican Elsevier
ER  -