Head, A. K. <br/><br/>
Computed electron micrographs and defect identification. 

 - AmsterdamNew York, N.Y. :  NorthHollandAmerican Elsevier,  1973. 
 - 400 p. 
 - Series defects in crystalline solids, v. <7> .
 - Series defects in crystalline solids, v. <7> .
<br/><br/><label>ISBN: </label>0720417570 0444104623