Part I: fourth annual SEM symposium and Part II: Workshop on forensic applications of the SEM... 

 - Chicago :  IIT Research institute,  1971. 
 - 618 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>MICROSCOPIOS ELECTRONICOS DE BARRIDO
<br/><br/><label>Universal Decimal Class. No.: </label>621.385.833.28