TY  - BOOK
AU  - Beaman,D.R.et al
ED  - Microbean analysis society
ED  - International congress on x-ray optics and microanalysis
TI  - X-ray optics and microanalysis
PY  - 1980///
CY  - Midland
PB  - Pendell publ.
KW  - MICROSCOPIA ELECTRONICA -CONGRESOS
KW  - MICROSCOPIOS ELECTRONICOS DE BARRIDO
ER  -