Beaman, D. R. et al <br/><br/>
X-ray optics and microanalysis. 

 - Midland :  Pendell publ.,  1980. 
 - 665 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>MICROSCOPIA ELECTRONICA -CONGRESOS<br/>MICROSCOPIOS ELECTRONICOS DE BARRIDO