Practical scanning electron microscopy:   electron and ion microprobe analysis. 

 - 3a ed. 
 - New York and London :  Plenum press,  1977. 
 - xxiii, 582 p. :  il., graf., fot.;  
<br/><br/><label>ISBN: </label>0306308207 
<br/><br/><label>Subjects--Topical Terms: </label><br/>MICROSCOPIA ELECTRONICA<br/>ELECTRON BEAMS<br/>HACES ELECTRONICOS<br/>SCANNING ELECTRON<br/>X-RAY EMISSION ANALYSIS<br/>ANALISIS POR EMISION DE RAYOS X<br/>SONDAS ELECTRONICAS<br/>ELECTRON PROBES