TY  - BOOK
AU  - Kyser,David F.
ED  - Conference on electron beam interactions with solids for microscopy, microanalysis and microlithography
ED  - Pfefferkorn conference
TI  - Electron beam interactions with solids for microscopy, microanalysis and microlithography
SN  - 0931288304
PY  - 1984///
CY  - AMF O'Hare, Il.
PB  - Scanning electron microscopy
KW  - RADIACIONES -EFECTOS EN SOLIDOS -CONGRESOS
KW  - MICROSCOPIA ELECTRONICA
N1  - Held at the Asilomar conference center; Bibliografía al final de cada artículo
ER  -