World Conference on Non Destructive Testing <WCNDT>.

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TextLanguage: en Language: en Series: Krishnadas, Nair ; | Baldev, Raj ; | Murthy, C.R.L ; | Jayamukar, T ; Publication details: New Delhi : Oxford and IBH publishing, c1996.Description: v. : il., tabla, diagrISBN:

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Item type	Home library	Call number	Copy number	Status	Barcode
Books	Centro de Información Eduardo Savino	620.179.1 T222 v.1 (Browse shelf(Opens below))	v.1 [p.ixxxiii, 1314, I18]	Available	51077
Books	Centro de Información Eduardo Savino	620.179.1 T222 v.1 (Browse shelf(Opens below))	v.Ab	Available	51081
Books	Centro de Información Eduardo Savino	620.179.1 T222 v.1 (Browse shelf(Opens below))	v.5	Available	51080
Books	Centro de Información Eduardo Savino	620.179.1 T222 v.1 (Browse shelf(Opens below))	v.4	Available	51082
Books	Centro de Información Eduardo Savino	620.179.1 T222 v.1 (Browse shelf(Opens below))	v.3	Available	51079
Books	Centro de Información Eduardo Savino	620.179.1 T222 v.1 (Browse shelf(Opens below))	v.2	Available	51078

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