Amazon cover image
Image from Amazon.com
Image from OpenLibrary

World Conference on Non Destructive Testing <WCNDT>.

By: Contributor(s): Material type: TextTextLanguage: en Language: en Series: Krishnadas, Nair ; | Baldev, Raj ; | Murthy, C.R.L ; | Jayamukar, T ; Publication details: New Delhi : Oxford and IBH publishing, c1996.Description: v. : il., tabla, diagrISBN:
  • 8120411234
Subject(s):
Tags from this library: No tags from this library for this title. Log in to add tags.

Bibliografía al final de cada artículo

There are no comments on this title.

to post a comment.