Focusing of charged particles.
Material type:
- 0126369011
Item type | Home library | Call number | Copy number | Status | Date due | Barcode | |
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Centro de Información Eduardo Savino | 537.534.3 Se63 v.1 (Browse shelf(Opens below)) | v.1 | Checked out | 18/12/2025 00:00 | 27599 | |
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Centro de Información Eduardo Savino | 537.534.3 Se63 v.1 (Browse shelf(Opens below)) | v.2 | Checked out | 18/12/2025 00:00 | 46628 | |
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Centro de Información Eduardo Savino | 537.534.3 Se63 v.1 (Browse shelf(Opens below)) | v.1, ej.2 | Available | 46629 |
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537.534.3 [021] C77 Handbook of ion beam processing technology : principles, deposition, film modification and synthesis. | 537.534.3 G585 Field emission and field ionization. | 537.534.3 L617 Phase-space dynamics of particles. | 537.534.3 Se63 v.1 Focusing of charged particles. | 537.534.3 Se63 v.1 Focusing of charged particles. | 537.534.3 Se63 v.1 Focusing of charged particles. | 537.534.3 Se63 v.2 Focusing of charged particles |
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