Text| Item type | Home library | Call number | Status | Barcode | |
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Centro de Información Eduardo Savino | 537.531 R5 (Browse shelf(Opens below)) | Available | 282 PMM |
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| 537.531 Am2 Energy dispersion x-ray analysis: x-ray and electron probe analysis. | 537.531 C548 Applied x-rays. | 537.531 I7 Proceedings. | 537.531 R5 Elemental X-ray analysis of materials EXAM methods. | 537.531 T5 Electron probe microanalysis. | 537.533.35 [075.8] Ec73 1981 Cours de l'ecole de microscopie électronique en science des materiaux. | 537.533.35 [075.8] Ec73 1981 Cours de l'ecole de microscopie électronique en science des materiaux. |
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