X-ray optics and microanalysis.
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TextPublication details: Midland : Pendell publ., 1980.Description: 665 pSubject(s):
| Item type | Home library | Call number | Status | Barcode | |
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Centro de Información Eduardo Savino | 537.533.35 In8 1977 (Browse shelf(Opens below)) | Available | 30147 |
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| 537.533.35 H615 Electron microscopy of thin crystals. | 537.533.35 H857 ej.2 Introduction to analytical electron microscopy. | 537.533.35 I61 Why the critical current densities of high-Tc's vary anomalously with temperature, field and time. | 537.533.35 In8 1977 X-ray optics and microanalysis. | 537.533.35 J841 Principles of analytical electron microscopy. | 537.533.35 K18 Techniques for electron microscopy. | 537.533.35 K18 Techniques for electron microscopy. |
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