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Total reflection X ray fluorescence analysis.
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TextLanguage: en Series: Chemical analysis, v.<140>Publication details: New York : John Wiley, 1997.Description: xvii, 245 p. : ilISBN: - 0471305243
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Centro de Información Eduardo Savino | 543.426 K692 (Browse shelf(Opens below)) | Available | 47857 |
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| 543.422 El87a2 Atomic-absorption spectrophotometry. | 543.423 [075.8] N214 1980 Emission and scattering techniques: studies of inorganic molecules, solids, and surfaces. | 543.423 J599 Particleinduced Xray emission spectrometry [PIXE]. | 543.426 K692 Total reflection X ray fluorescence analysis. | 543.426 Se52 1978 Analisis por fluorescencia de rayos X. | 543.426 T279 Principles of quantitative X-ray fluorescence analysis. | 543.429.23 H191 HANDBOOK of proton NMR [nuclear magnetic resonance] spectra and data. |
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