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Quantitative Xray diffractometry.

Zevin, Lev S.

Quantitative Xray diffractometry. - New York : Springer, 1995. - xvii, 372 p. : tabla, diagr.

Bibliografía: p.355-364

ISBN: 0387945415

Subjects--Topical Terms:
DIFRACCION DE RAYOS X
DIFRACCION DE RAYOS X -APLICACIONES INDUSTRIALES
RAYOS X -ANALISIS
ANALISIS CUANTITATIVO

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