Normal view MARC view ISBD view

Principles of analytical electron microscopy.

Joy, David C.

Principles of analytical electron microscopy. - New York and London : Plenum Press, 1986. - xvi, 448 p. : il.

Bibliografía al final de cada capítulo

ISBN: 0306423871

Subjects--Topical Terms:
MICROSCOPIA ELECTRONICA

Place hold
Print
Cite
Add to your cart (remove)
Send to device
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)